Facilities: FIB
TEM | SEM
JEOL JEM-9320FIB

• Acc. Voltage: 5 ~ 30 kV (5kV step)
• SIM image resolution = 6 nm (30kV)
• Probe current = 30 nA
• Tungsten and Carbon depositions
• Maximum sample size: 8x8x1 mm3
• Option: TEM sample stage, System to pick up a sample


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